Quantitative Raman Spectrum and Reliable Thickness Identification for Atomic Layers on Insulating Substrates

Published 2012 View Full Article

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Title
Quantitative Raman Spectrum and Reliable Thickness Identification for Atomic Layers on Insulating Substrates
Authors
Keywords
-
Journal
ACS Nano
Volume 6, Issue 8, Pages 7381-7388
Publisher
American Chemical Society (ACS)
Online
2012-07-28
DOI
10.1021/nn3025173

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