Characterization of Impurity Doping and Stress in Si/Ge and Ge/Si Core–Shell Nanowires

Published 2012 View Full Article

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Title
Characterization of Impurity Doping and Stress in Si/Ge and Ge/Si Core–Shell Nanowires
Authors
Keywords
-
Journal
ACS Nano
Volume 6, Issue 10, Pages 8887-8895
Publisher
American Chemical Society (ACS)
Online
2012-09-05
DOI
10.1021/nn302881w

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