Electrical Property Heterogeneity at Transparent Conductive Oxide/Organic Semiconductor Interfaces: Mapping Contact Ohmicity Using Conducting-Tip Atomic Force Microscopy

Published 2012 View Full Article

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Title
Electrical Property Heterogeneity at Transparent Conductive Oxide/Organic Semiconductor Interfaces: Mapping Contact Ohmicity Using Conducting-Tip Atomic Force Microscopy
Authors
Keywords
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Journal
ACS Nano
Volume 6, Issue 11, Pages 9623-9636
Publisher
American Chemical Society (ACS)
Online
2012-10-03
DOI
10.1021/nn303043y

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