Combining TEM, AFM, and Profilometry for Quantitative Topography Characterization Across All Scales

Published 2018 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Combining TEM, AFM, and Profilometry for Quantitative Topography Characterization Across All Scales
Authors
Keywords
-
Journal
ACS Applied Materials & Interfaces
Volume 10, Issue 34, Pages 29169-29178
Publisher
American Chemical Society (ACS)
Online
2018-07-28
DOI
10.1021/acsami.8b09899

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.