Systematic Reliability Study of Top-Gate p- and n-Channel Organic Field-Effect Transistors

Title
Systematic Reliability Study of Top-Gate p- and n-Channel Organic Field-Effect Transistors
Authors
Keywords
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Journal
ACS Applied Materials & Interfaces
Volume 6, Issue 5, Pages 3378-3386
Publisher
American Chemical Society (ACS)
Online
2014-02-13
DOI
10.1021/am405424k

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