Photobias Instability of High Performance Solution Processed Amorphous Zinc Tin Oxide Transistors

Title
Photobias Instability of High Performance Solution Processed Amorphous Zinc Tin Oxide Transistors
Authors
Keywords
-
Journal
ACS Applied Materials & Interfaces
Volume 5, Issue 8, Pages 3255-3261
Publisher
American Chemical Society (ACS)
Online
2013-03-29
DOI
10.1021/am400110y

Ask authors/readers for more resources

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started