Journal
ACS APPLIED MATERIALS & INTERFACES
Volume 5, Issue 24, Pages 13006-13011Publisher
AMER CHEMICAL SOC
DOI: 10.1021/am403853y
Keywords
nitronyl nitroxides; X-ray photoelectron spectroscopy; XPS; magnetism; thin film growth; organic paramagnets on surfaces
Funding
- DFG [CA852/5-1]
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Aiming at future technological applications, we describe the interface and the thin film processes of a pyrene-substituted nitronyl nitroxide radical deposited on Al2O3(11-20) single crystals. Electronic properties, chemical environment at the interface, and morphology of the thin films have been investigated by a multitechnique approach. Spectroscopic and morphologic analyses indicate a Stranski-Krastanov growth mode and weak physisorption of the molecules on the surface. The deposition does not affect the paramagnetic character of the molecules. The results presented in this paper show not only that the investigated system is a promising candidate as a model for understanding thin film processes in purely organic-based magnets, but its characteristics are worth its future use in electronics, because the radical character of the molecules is completely preserved in the thin films.
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