Effect of the Electrode Materials on the Drain-Bias Stress Instabilities of In–Ga–Zn–O Thin-Film Transistors

Published 2012 View Full Article

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Title
Effect of the Electrode Materials on the Drain-Bias Stress Instabilities of In–Ga–Zn–O Thin-Film Transistors
Authors
Keywords
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Journal
ACS Applied Materials & Interfaces
Volume 4, Issue 10, Pages 5369-5374
Publisher
American Chemical Society (ACS)
Online
2012-09-14
DOI
10.1021/am301253x

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