Integrated X-ray fluorescence and diffuse visible-to-near-infrared reflectance scanner for standoff elemental and molecular spectroscopic imaging of paints and works on paper

Title
Integrated X-ray fluorescence and diffuse visible-to-near-infrared reflectance scanner for standoff elemental and molecular spectroscopic imaging of paints and works on paper
Authors
Keywords
Reflectance imaging spectroscopy, MA-XRF, X-ray fluorescence, FORS, Pigment mapping
Journal
Heritage Science
Volume 6, Issue 1, Pages -
Publisher
Springer Nature
Online
2018-05-18
DOI
10.1186/s40494-018-0197-y

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