Electric shielding films for biased TEM samples and their application to in situ electron holography

Published 2018 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
Electric shielding films for biased TEM samples and their application to in situ electron holography
Authors
Keywords
-
Journal
Microscopy
Volume 67, Issue 3, Pages 178-186
Publisher
Oxford University Press (OUP)
Online
2018-06-01
DOI
10.1093/jmicro/dfy018

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.