Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysis

Published 2018 View Full Article

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Title
Nanoscale residual stress depth profiling by Focused Ion Beam milling and eigenstrain analysis
Authors
Keywords
FIB-DIC ring core, Residual stress, Eigenstrain, Depth profiling, Nano resolution, XRD
Journal
MATERIALS & DESIGN
Volume 145, Issue -, Pages 55-64
Publisher
Elsevier BV
Online
2018-02-21
DOI
10.1016/j.matdes.2018.02.044

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