Surface mapping of field-induced piezoelectric strain at elevated temperature employing full-field interferometry

Published 2015 View Full Article

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Title
Surface mapping of field-induced piezoelectric strain at elevated temperature employing full-field interferometry
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL
Volume 62, Issue 1, Pages 88-96
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2015-01-14
DOI
10.1109/tuffc.2014.006683

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