Replicating and Re-Evaluating the Theory of Relative Defect-Proneness

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Title
Replicating and Re-Evaluating the Theory of Relative Defect-Proneness
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON SOFTWARE ENGINEERING
Volume 41, Issue 2, Pages 176-197
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2014-10-02
DOI
10.1109/tse.2014.2361131

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