Journal
CRYSTALS
Volume 8, Issue 5, Pages -Publisher
MDPI
DOI: 10.3390/cryst8050212
Keywords
diffraction peak profile analysis (DPPA); contrast factor; dislocations; twinning; crystal plasticity; planar faults; powder diffraction
Funding
- European Regional Development Fund as part of the Ser Cymru II program
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Diffraction peak profile analysis (DPPA) is a valuable method to understand the microstructure and defects present in a crystalline material. Peak broadening anisotropy, where broadening of a diffraction peak doesn't change smoothly with 2 or d-spacing, is an important aspect of these methods. There are numerous approaches to take to deal with this anisotropy in metal alloys, which can be used to gain information about the dislocation types present in a sample and the amount of planar faults. However, there are problems in determining which method to use and the potential errors that can result. This is particularly the case for hexagonal close packed (HCP) alloys. There is though a distinct advantage of broadening anisotropy in that it provides a unique and potentially valuable way to develop crystal plasticity and work-hardening models. In this work we use several practical examples of the use of DPPA to highlight the issues of broadening anisotropy.
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