A Global Analysis of Light and Charge Yields in Liquid Xenon

Published 2015 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
A Global Analysis of Light and Charge Yields in Liquid Xenon
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 62, Issue 6, Pages 3387-3396
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2015-11-05
DOI
10.1109/tns.2015.2481322

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.