Intensity analysis of polarized Raman spectra for off axis single crystal silicon

Published 2018 View Full Article

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Title
Intensity analysis of polarized Raman spectra for off axis single crystal silicon
Authors
Keywords
Raman spectroscopy, Polarization analysis, Silicon, Electronic materials, Optical characterization
Journal
Materials Science and Engineering B-Advanced Functional Solid-State Materials
Volume 230, Issue -, Pages 31-42
Publisher
Elsevier BV
Online
2018-01-20
DOI
10.1016/j.mseb.2017.12.040

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