A New Method for Dielectric Characterization in Sub-THz Frequency Range

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Title
A New Method for Dielectric Characterization in Sub-THz Frequency Range
Authors
Keywords
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Journal
IEEE Transactions on Terahertz Science and Technology
Volume 8, Issue 1, Pages 19-26
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2017-12-05
DOI
10.1109/tthz.2017.2771309

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