A Generic Deep-Learning-Based Approach for Automated Surface Inspection

Authors

Keywords

Journal

Volume 48, Issue 3, Pages 929-940

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2017-02-25

DOI

10.1109/tcyb.2017.2668395

Explore over 38,000 international journals covering a vast array of academic fields.

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started