Conductive Atomic Force Microscopy of Small Magnetic Tunnel Junctions With Interface Anisotropy

Authors

Keywords

Journal

Volume 51, Issue 11, Pages 1-4

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2015-05-19

DOI

10.1109/tmag.2015.2434798

Explore over 38,000 international journals covering a vast array of academic fields.

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now