4.4 Article

Trap-assisted transition between Schottky emission and Fowler-Nordheim tunneling in the interfacial-memristor based on Bi2S3 nano-networks

Journal

AIP ADVANCES
Volume 8, Issue 3, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.5006433

Keywords

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Funding

  1. NSFC [11547163, 11604091, 1547186]
  2. Hunan provincial natural science foundation [2015JJ6015]
  3. Hunan Province Higher Education Key Laboratory of Modeling and Monitoring on the Near-Earth Electromagnetic Environments, Changsha University of Science Technology
  4. research foundation of education bureau of Hunan province, China [16B048]
  5. China Scholarship Council (CSC) [201508430266]

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For the usage of the memristors in functional circuits, a predictive physical model is of great importance. However, other than the developments of the memristive models accounting bulky effects, the achievements on simulating the interfacial memristance are still insufficient. Here we provide a physical model to describe the electrical switching of the memristive interface. It considers the trap-assisted transition between Schottky emission and Fowler-Nordheim tunneling, and successfully reproduces the memristive behaviors occurring on the interface between Bi2S3 nano-networks and F-doped SnO2. Such success not only allows us uncover several features of the memristive interface including the distribution nature of the traps, barrier heightthickness and so on, but also provides a foundation from which we can quantitatively simulate the real interfacial memristor. (c) 2018 Author(s).

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