Analysis of the Excellent Memory Disturb Characteristics of a Hourglass-Shaped Filament in Al2O3/Cu-Based CBRAM Devices

Published 2015 View Full Article

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Title
Analysis of the Excellent Memory Disturb Characteristics of a Hourglass-Shaped Filament in Al2O3/Cu-Based CBRAM Devices
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 62, Issue 6, Pages 2007-2013
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2015-05-08
DOI
10.1109/ted.2015.2423094

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