General Geometric Fluctuation Modeling for Device Variability Analysis

Title
General Geometric Fluctuation Modeling for Device Variability Analysis
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 62, Issue 11, Pages 3588-3594
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2015-10-14
DOI
10.1109/ted.2015.2480013

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