AC-Capacitance Techniques for Interface Trap Analysis in GaN-Based Buried-Channel MIS-HEMTs

Published 2015 View Full Article

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Title
AC-Capacitance Techniques for Interface Trap Analysis in GaN-Based Buried-Channel MIS-HEMTs
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 62, Issue 6, Pages 1870-1878
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2015-05-08
DOI
10.1109/ted.2015.2420690

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