Modelling electron beam induced dynamics in metallic nanoclusters

Title
Modelling electron beam induced dynamics in metallic nanoclusters
Authors
Keywords
Clusters, Time-resolved STEM, Knock-on damage, Beam damage, Electron beam induced atom dynamics
Journal
ULTRAMICROSCOPY
Volume 192, Issue -, Pages 69-79
Publisher
Elsevier BV
Online
2018-06-02
DOI
10.1016/j.ultramic.2018.05.007

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