Concept and design of a beam blanker with integrated photoconductive switch for ultrafast electron microscopy

Published 2018 View Full Article

Authors

Keywords

Ultrafast electron microscopy (UEM), Beam blankers, Photoconductive switches, Scanning electron microscopy (SEM), Transmission electron microscopy (TEM)

Journal

ULTRAMICROSCOPY

Volume 184, Issue -, Pages 8-17

Publisher

Elsevier BV

Online

2017-10-14

DOI

10.1016/j.ultramic.2017.10.002

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