Systematic approaches for targeting an atom-probe tomography sample fabricated in a thin TEM specimen: Correlative structural, chemical and 3-D reconstruction analyses
Systematic approaches for targeting an atom-probe tomography sample fabricated in a thin TEM specimen: Correlative structural, chemical and 3-D reconstruction analyses
Authors
Keywords
Atom probe tomography (APT), Transmission electron microscope (TEM), Metal-carbide phase precipitate, Correlative study, 3-D reconstruction, Sample preparation
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