Picometer-scale atom position analysis in annular bright-field STEM imaging

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Title
Picometer-scale atom position analysis in annular bright-field STEM imaging
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 184, Issue -, Pages 177-187
Publisher
Elsevier BV
Online
2017-09-12
DOI
10.1016/j.ultramic.2017.09.001

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