4.4 Article

Automated approaches for band gap mapping in STEM-EELS

Journal

ULTRAMICROSCOPY
Volume 184, Issue -, Pages 39-45

Publisher

ELSEVIER SCIENCE BV
DOI: 10.1016/j.ultramic.2017.08.006

Keywords

STEM; EELS; Spectrum images; Band gap measurements

Categories

Funding

  1. Research Council of Norway [197405/F50, 197411/V30]

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Band gap variations in thin film structures, across grain boundaries, and in embedded nanoparticles are of increasing interest in the materials science community. As many common experimental techniques for measuring band gaps do not have the spatial resolution needed to observe these variations directly, probe-corrected Scanning Transmission Electron Microscope (STEM) with monochromated Electron Energy-Loss Spectroscopy (EELS) is a promising method for studying band gaps of such features. However, extraction of band gaps from EELS data sets usually requires heavy user involvement, and makes the analysis of large data sets challenging. Here we develop and present methods for automated extraction of band gap maps from large STEM-EELS data sets with high spatial resolution while preserving high accuracy and precision. (C) 2017 Elsevier B.V. All rights reserved.

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