Oxidation of polycrystalline copper films – Pressure and temperature dependence

Title
Oxidation of polycrystalline copper films – Pressure and temperature dependence
Authors
Keywords
Copper, Oxidation, Cuprous oxide, Cupric oxide, Phase diagram, Thin films, Optical spectroscopy, XPS, Tauc method
Journal
THIN SOLID FILMS
Volume 651, Issue -, Pages 24-30
Publisher
Elsevier BV
Online
2018-02-06
DOI
10.1016/j.tsf.2018.02.007

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