Modeling the instability behavior of thin film devices: Fermi Level Pinning

Published 2018 View Full Article

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Title
Modeling the instability behavior of thin film devices: Fermi Level Pinning
Authors
Keywords
Modeling, Degradation, Recovery, Fermi Level Pinning, Thin film, CdTe
Journal
SUPERLATTICES AND MICROSTRUCTURES
Volume 117, Issue -, Pages 399-405
Publisher
Elsevier BV
Online
2018-03-29
DOI
10.1016/j.spmi.2018.03.045

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