Thickness and temperature dependent thermoelectric properties of Bi87Sb13 nanofilms measured with a novel measurement platform

Published 2018 View Full Article

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Title
Thickness and temperature dependent thermoelectric properties of Bi87Sb13 nanofilms measured with a novel measurement platform
Authors
Keywords
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Journal
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume 33, Issue 8, Pages 085014
Publisher
IOP Publishing
Online
2018-06-26
DOI
10.1088/1361-6641/aacf39

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