In-depth study of in-trap high-resolution mass separation by transversal ion ejection from a multi-reflection time-of-flight device

Title
In-depth study of in-trap high-resolution mass separation by transversal ion ejection from a multi-reflection time-of-flight device
Authors
Keywords
-
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 89, Issue 1, Pages 015114
Publisher
AIP Publishing
Online
2018-01-30
DOI
10.1063/1.5009167

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