Journal
PROGRESS IN PHOTOVOLTAICS
Volume 26, Issue 11, Pages 949-954Publisher
WILEY
DOI: 10.1002/pip.3033
Keywords
Cu(In,Ga)Se-2 (CIGS); current-voltage characteristics; photovoltaic cells; semiconductor device modeling; thin films
Funding
- US Department of Energy, Office of Energy Efficiency and Renewable Energy, Solar Energy Technologies Office [SuNLaMP 30296]
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We improved the efficiency of ultra-thin (0.49-m-thick) Cu(In,Ga)Se-2 solar cells to 15.2% (officially measured). To achieve these results, we modified growth conditions from the 3-stage process but did not add post-deposition treatments or additional material layers. The increase in device efficiency is attributed to a steeper Ga gradient in the CIGS with higher Ga content near the Mo back contact, which can hinder electron-hole recombination at the interface. We discuss device measurements and film characterization for ultra-thin CIGS. Modeling is presented that shows the route to even higher efficiencies for devices with CIGS thicknesses of 0.5 mu m.
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