Dimensional metrology with X-ray CT: A comparison with CMM measurements on internal features and compliant structures

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Title
Dimensional metrology with X-ray CT: A comparison with CMM measurements on internal features and compliant structures
Authors
Keywords
-
Journal
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY
Volume 51, Issue -, Pages 291-307
Publisher
Elsevier BV
Online
2017-08-31
DOI
10.1016/j.precisioneng.2017.08.021

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