Investigation of Lithium Insertion Mechanisms of a Thin-Film Si Electrode by Coupling Time-of-Flight Secondary-Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Focused-Ion-Beam/SEM

Published 2015 View Full Article

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Title
Investigation of Lithium Insertion Mechanisms of a Thin-Film Si Electrode by Coupling Time-of-Flight Secondary-Ion Mass Spectrometry, X-ray Photoelectron Spectroscopy, and Focused-Ion-Beam/SEM
Authors
Keywords
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Journal
ACS Applied Materials & Interfaces
Volume 7, Issue 50, Pages 27853-27862
Publisher
American Chemical Society (ACS)
Online
2015-12-01
DOI
10.1021/acsami.5b09261

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