Scanning Kelvin Probe Microscopy investigation of the contact resistances and charge mobility in n-type PDIF-CN 2 thin-film transistors

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Title
Scanning Kelvin Probe Microscopy investigation of the contact resistances and charge mobility in n-type PDIF-CN 2 thin-film transistors
Authors
Keywords
-
Journal
ORGANIC ELECTRONICS
Volume 52, Issue -, Pages 206-212
Publisher
Elsevier BV
Online
2017-10-21
DOI
10.1016/j.orgel.2017.10.021

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