Dual-polarization interference microscopy for advanced quantification of phase associated with the image field

Title
Dual-polarization interference microscopy for advanced quantification of phase associated with the image field
Authors
Keywords
-
Journal
OPTICS LETTERS
Volume 43, Issue 3, Pages 427
Publisher
The Optical Society
Online
2018-01-19
DOI
10.1364/ol.43.000427

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