Journal
OPTICS EXPRESS
Volume 26, Issue 10, Pages 12558-12568Publisher
OPTICAL SOC AMER
DOI: 10.1364/OE.26.012558
Keywords
-
Categories
Funding
- BMBF via Eurostars project INSPECT [E! 10823]
Ask authors/readers for more resources
In many industrial fields, like automotive and painting industry, the thickness of thin layers is a crucial parameter for quality control. Hence, the demand for thickness measurement techniques continuously grows. In particular, non-destructive and contact-free terahertz techniques access a wide range of thickness determination applications. However, terahertz time-domain spectroscopy based systems perform the measurement in a sampling manner, requiring fixed distances between measurement head and sample. In harsh industrial environments vibrations of sample and measurement head distort the time-base and decrease measurement accuracy. We present an interferometer-based vibration correction for terahertz time-domain measurements, able to reduce thickness distortion by one order of magnitude for vibrations with frequencies up to 100Hz and amplitudes up to 100 mu m. We further verify the experimental results by numerical calculations and find very good agreement. (C) 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available