First principles predictions of magneto-optical data for semiconductor point defect identification: the case of divacancy defects in 4H–SiC

Title
First principles predictions of magneto-optical data for semiconductor point defect identification: the case of divacancy defects in 4H–SiC
Authors
Keywords
-
Journal
NEW JOURNAL OF PHYSICS
Volume 20, Issue 2, Pages 023035
Publisher
IOP Publishing
Online
2018-01-13
DOI
10.1088/1367-2630/aaa752

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