Multiple-ellipse fitting method to precisely measure the positions of atomic columns in a transmission electron microscope image

Published 2018 View Full Article

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Title
Multiple-ellipse fitting method to precisely measure the positions of atomic columns in a transmission electron microscope image
Authors
Keywords
-
Journal
MICRON
Volume 113, Issue -, Pages 99-104
Publisher
Elsevier BV
Online
2018-07-06
DOI
10.1016/j.micron.2018.06.016

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