Diffuse reflectance spectroscopy: An effective tool to probe the defect states in wide band gap semiconducting materials

Published 2018 View Full Article

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Title
Diffuse reflectance spectroscopy: An effective tool to probe the defect states in wide band gap semiconducting materials
Authors
Keywords
-
Journal
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Volume 86, Issue -, Pages 151-156
Publisher
Elsevier BV
Online
2018-07-05
DOI
10.1016/j.mssp.2018.06.025

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