Near-Field Characterization of Graphene Plasmons by Photo-Induced Force Microscopy

Title
Near-Field Characterization of Graphene Plasmons by Photo-Induced Force Microscopy
Authors
Keywords
-
Journal
Laser & Photonics Reviews
Volume -, Issue -, Pages 1800040
Publisher
Wiley
Online
2018-07-13
DOI
10.1002/lpor.201800040

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