Automated tracing of helical assemblies from electron cryo-micrographs

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Title
Automated tracing of helical assemblies from electron cryo-micrographs
Authors
Keywords
Electron cryo-microscopy, Helical assemblies, Automated particle detection, Image pattern recognition, Persistence length
Journal
JOURNAL OF STRUCTURAL BIOLOGY
Volume 202, Issue 1, Pages 1-12
Publisher
Elsevier BV
Online
2017-12-02
DOI
10.1016/j.jsb.2017.11.013

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