Journal
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Volume 222, Issue -, Pages 10-14Publisher
ELSEVIER SCIENCE BV
DOI: 10.1016/j.elspec.2017.10.005
Keywords
X-ray photoelectron spectroscopy; XPS; Auger; Surface analysis; Copper
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Funding
- Slovenian Research Agency [BI-HR/16-17-046, P2-0032]
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In this work, surface analysis by measuring high-resolution Auger Cu L3L4,5M4,5 spectra was performed at very low take-off angles using X-ray photoelectron spectroscopy. The focus of this research was on determining if a fingerprint feature exists for a specific connection between Cu(I) (and/or Cu(II)) and different organic molecules. These organic molecules were adsorbed on Cu surface from 3 wt.% NaCl solution containing a 1 mM concentration of organic compound, i.e. 4-methyl-2-phenylimidazole, benzotriazole, 3-amino-1,2,4-trazole, 1,2,4-triazole, 2-mercaptobenzimidazole, 2-mercaptobenzoxazole, 2-mercaptobenzothiazole, 1-hydroxybenzotriazole, and 2-mercapto-1-methylimidazole. This feature was shown to be connected to Cu(I)- and/or Cu(II)-complex formation. (C) 2017 Elsevier B.V. All rights reserved.
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