Trends in XPS instrumentation for industrial surface analysis and materials characterisation

Published 2018 View Full Article

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Title
Trends in XPS instrumentation for industrial surface analysis and materials characterisation
Authors
Keywords
X-ray photoelectron spectroscopy, XPS imaging, UV-photoemission, Ion scattering spectroscopy, Ar cluster ion source
Journal
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Volume -, Issue -, Pages -
Publisher
Elsevier BV
Online
2018-03-08
DOI
10.1016/j.elspec.2018.03.002

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