Using time of flight secondary ion mass spectrometry and field emission scanning electron microscopy with energy dispersive X-ray spectroscopy to determine the role of soil components in competitive copper and cadmium migration and fixation in soils

Published 2015 View Full Article

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Title
Using time of flight secondary ion mass spectrometry and field emission scanning electron microscopy with energy dispersive X-ray spectroscopy to determine the role of soil components in competitive copper and cadmium migration and fixation in soils
Authors
Keywords
Soils, Cd, Cu, Simultaneous sorption, Fixation, TOF-SIMS, FE-SEM/EDS
Journal
GEODERMA
Volume 251-252, Issue -, Pages 65-77
Publisher
Elsevier BV
Online
2015-04-06
DOI
10.1016/j.geoderma.2015.03.026

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