Omni-Ensemble Learning (OEL): Utilizing Over-Bagging, Static and Dynamic Ensemble Selection Approaches for Software Defect Prediction

Title
Omni-Ensemble Learning (OEL): Utilizing Over-Bagging, Static and Dynamic Ensemble Selection Approaches for Software Defect Prediction
Authors
Keywords
-
Publisher
World Scientific Pub Co Pte Lt
Online
2018-07-18
DOI
10.1142/s0218213018500240

Ask authors/readers for more resources

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More