Omni-Ensemble Learning (OEL): Utilizing Over-Bagging, Static and Dynamic Ensemble Selection Approaches for Software Defect Prediction
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Title
Omni-Ensemble Learning (OEL): Utilizing Over-Bagging, Static and Dynamic Ensemble Selection Approaches for Software Defect Prediction
Authors
Keywords
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Journal
International Journal on Artificial Intelligence Tools
Volume -, Issue -, Pages -
Publisher
World Scientific Pub Co Pte Lt
Online
2018-07-18
DOI
10.1142/s0218213018500240
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