Zero-Shot Learning - A Comprehensive Evaluation of the Good, the Bad and the Ugly

Title
Zero-Shot Learning - A Comprehensive Evaluation of the Good, the Bad and the Ugly
Authors
Keywords
-
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2018-07-20
DOI
10.1109/tpami.2018.2857768

Ask authors/readers for more resources

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started