Estimation of the Single-Event Upset Sensitivity of Advanced SOI SRAMs

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Title
Estimation of the Single-Event Upset Sensitivity of Advanced SOI SRAMs
Authors
Keywords
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Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 65, Issue 1, Pages 339-345
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2017-12-05
DOI
10.1109/tns.2017.2779786

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