SPSIM: A Superpixel-Based Similarity Index for Full-Reference Image Quality Assessment

Published 2018 View Full Article

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Title
SPSIM: A Superpixel-Based Similarity Index for Full-Reference Image Quality Assessment
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON IMAGE PROCESSING
Volume 27, Issue 9, Pages 4232-4244
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2018-05-17
DOI
10.1109/tip.2018.2837341

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